Tipology:
Invited papers
2004 - LACAITA ANDREA LEONARDO, IELMINI DANIELE, TOSI ALBERTO
A. Pirovano, A. Redaelli, F. Pellizzer, F. Ottogalli, M. Tosi, D. Ielmini, A. L. Lacaita, R. Bez "Reliability study of phase-change nonvolatile memories," IEEE Transactions on Device and Materials Reliability 4, 422 - 427, 2004.