Laboratories
Description
Probe stations
Climatic Chamber
Optical microscopes
Instrumentation for test and characterization of detectors:
- LCR-meter
- Semiconductor device Analyzer
- Spectrum Analyzer
- Programmable Electrometer
- Instruments for I-V and C-V characterization
CAD software for devices and VLSI circuits development
Acquisition Systems:
- Shaper Amplifiers (unipolar and bipolar)
- Multichannel Analyzer/Dual Input Multiscaler
- ADC + acquisition board
- Single Channel Analyzer & Time to Amplitude Converter
Pulsers and Functions / Arbitrary wave generator
Digital real-time oscilloscopes with bands up to 1 GHz
Logic State Analyzers up to 2 GHz
Network analyzer
