2014 - IELMINI DANIELE
Best Poster Award for the paper “Voltage-Dependent Random Telegraph Noise (RTN) in HfOx Resistive RAM,” by S. Balatti, S. Ambrogio, A. Cubeta, A. Calderoni, N. Ramaswamy, and D. Ielmini, presented by S. Balatti at the International Reliability Physics Symposium (IRPS) 2014