Tipology:
Invited papers
2013 - LACAITA ANDREA LEONARDO, SOTTOCORNOLA SPINELLI ALESSANDRO, MONZIO COMPAGNONI CHRISTIAN
C. Miccoli, C. Monzio Compagnoni, L. Chiavarone, S. Beltrami, A. L. Lacaita, A. S. Spinelli, and A. Visconti, "Reliability characterization issues for nanoscale Flash memories: a case study on 45-nm NOR devices," IEEE Trans. Device Mater. Rel., vol. 13, pp. 362-369, June 2013.