2009 - IELMINI DANIELE
D. Ielmini, "Reliability and scaling challenges of phase-change memories from a physical-modeling perspective", Proc. International Symposium on Next-Generation Tera-bit Memory Technology, 131-132 (2009)
D. Ielmini, "Reliability and scaling challenges of phase-change memories from a physical-modeling perspective", Proc. International Symposium on Next-Generation Tera-bit Memory Technology, 131-132 (2009)