Invited talk
Awards

Invited talk

Tipology:

Invited talks

Research area:

Research lines:

2007 - SOTTOCORNOLA SPINELLI ALESSANDRO, IELMINI DANIELE

A. S. Spinelli and D. Ielmini, "A physical look at some reliability aspects of NOR Flash memories'', IRPS Tutorial (2005). D. Ielmini, "Reliability Year-in Review,'' IRPS Review (2007).