Invited talk
2014 - IELMINI DANIELE
D. Ielmini, S. Balatti and S. Ambrogio “Scaling of oxide-based resistive switching devices,”Nonvolatile Memory Technology Symposium (NVMTS), Jeju Island, Korea, October 25-27, 2014. DOI: 10.1109/NVMTS.2014.7060839
