Alberto Tosi was born in Borgomanero, Italy, in 1975. He received the master’s degree (cum laude) in Electronics Engineering and the Ph.D. degree (cum laude) in Information Technology Engineering from the Politecnico di Milano, Italy, in 2001 and 2005, respectively. From 2006 to 2014, he was an Assistant Professor, from 2014 to 2024, he was an Associate Professor, since 2024, he has been Full Professor of electronics with the Politecnico di Milano, Italy. In 2004, he was a summer student with IBM T. J. Watson Research Center, Yorktown Heights, NY, working on optical testing of CMOS circuits. His research interests include arrays of SPADs for scientific, industrial and commercial 2-D and 3-D applications, and he is currently focusing on InGaAs/InP, Ge-on-Si and silicon single-photon avalanche diodes (SPADs).