I am an Associate Professor (RTD-B) of Computer Engineering at Dipartimento di Elettronica, Informazione e Bioingegneria of the Politecnico di Milano (DEIB). At DEIB I have also received the Ph.D. in information technology (2008), and before I graduated in Mathematics at Università Statale di Milano (2004).
My research interests concern image processing and machine learning, and in particular image restoration and analysis, change/anomaly detection, domain adaptation, learning in nonstationary environments. Since 2016 I have been teaching PhD courses concerning image processing and classification in Politecnico di Milano and Tampere University (Finland). I also gave a few tutorials on change/anomaly detection in major IEEE conferences (ICASSP and IJCNN).

I am currently leading a few industrial research projects related to image understanding and anomaly detection. Together with Gilardoni Raggi X we design algorithms for X-ray inspection systems, with STMicroelectronics we investigate deep-learning models for monitoring silicon wafer production, with Cleafy we design anomaly-detection algorithms for web session monitoring. I published more than 70 papers in international conferences and journals and I am currently Associate Editor for the IEEE Transactions on Image Processing and for the IEEE Computational Intelligence Magazine. In 2015 I received the IBM Faculty Award, in 2016 the IEEE Transactions on Neural Networks and Learning Systems Outstanding Paper Award, and in 2017 the Nokia Visiting Professor Scholarship.